What Causes to Tune a Condition of Exactly Identical Fault- Masks Behaviors in an LFSR based BIST Methodology
نویسنده
چکیده
The authors show that in a Built-In Self-Test (BIST) technique, based on linear-feedback shift registers, when the feedback connections in pseudo-random test-sequence generator and signature analyzer are images of each other and corresponds to primitive characteristic polynomial then behaviors of faults masking remains identical. The simulation results of single stuck-at faults show how the use of such feedback connections in pseudo-random test-sequence generator and signature analyzer yields to mask the same faults. Oriental Journal of Computer Science and Technology Journal Website: www.computerscijournal.org ISSN: 0974-6471, Vol. 10, No. (4) 2017, Pg. 710-717
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